Description

On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.

INFO

Published Date :

2025-09-05T17:16:16.345Z

Last Modified :

2025-09-05T18:07:49.930Z

Source :

Toreon
AFFECTED PRODUCTS

The following products are affected by CVE-2025-9709 vulnerability.

No data.

REFERENCES

Here, you will find a curated list of external links that provide in-depth information to CVE-2025-9709.

URL Resource
https://nvd.nist.gov/vuln/detail/CVE-2020-27211 cve-icon cve-icon
https://raelize.com/upload/research/2022/No_Hat_2022_-_Glitching_devices_for_code_execution_v1.1.pdf cve-icon cve-icon
https://raelize.com/upload/research/2025/Dartmouth_202505_False-Injections-Tales-of-Physics-Misconceptions-and-Weird-Machines_v1.1.pdf cve-icon cve-icon
https://www.toreon.com/cve-2025-9709-major-vulnerability-in-common-chip/ cve-icon cve-icon
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CVSS Vulnerability Scoring System

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