Description

Memory corruption while handling test pattern generator IOCTL command.

INFO

Published Date :

2025-06-03T05:52:50.844Z

Last Modified :

2025-06-03T13:32:03.256Z

Source :

qualcomm
AFFECTED PRODUCTS

The following products are affected by CVE-2024-53017 vulnerability.

Vendors Products
Qualcomm
  • Sdm429w
  • Sdm429w Firmware
  • Snapdragon 429 Mobile Platform
  • Snapdragon 429 Mobile Platform Firmware
  • Wcn3620
  • Wcn3620 Firmware
  • Wcn3660b
  • Wcn3660b Firmware
REFERENCES

Here, you will find a curated list of external links that provide in-depth information to CVE-2024-53017.

URL Resource
https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html cve-icon cve-icon
Login to claim this CVE

CVSS Vulnerability Scoring System

Detailed values of each vector for above chart.
Attack Vector
Attack Complexity
Privileges Required
User Interaction
Scope
Confidentiality Impact
Integrity Impact
Availability Impact